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Scanning Electron Microscopy

Hitachi S-4800 Field Emission Scanning Electron Microscope with Oxford INCA X-Act EDS System

Our Hitachi S-4800 FESEM provides optics for high resolution imaging of the surface of structures in the nanometer range. The Super ExB Filter collects and separates the various components of pure SE, compositional SE and BSE electron signals. A STEM unit offers both brightfield and darkfield transmitted electron imaging. We have added an Oxford INCA Energy 250 energy-dispersive X-ray spectroscopy system for elemental analysis.

Users have been trained on this instrument for biological applications ranging from systematic identification of insects to proteins embedded in cell membranes and for materials applications ranging from carbon nanotubes to thin films for fuel cells.

 

The Hitachi S-4800 FESEM and Oxford INCA EDS system were acquired with funding from the National Science Foundation under Grant No. DBI-0821442 and matching funds provided by the Vice Chancellor for Research and Graduate Education of the University of Hawai'i at Manoa.

 

 

Scanning electron microscopy works by scanning a beam of electrons across the surface of a sample and detecting the particles that are emitted from it. These may include secondary electrons, backscattered electrons, and X-rays.

Gecko toes

Carbon nanotubes

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